Industrial and Intellectual Property

  • Analytical potential of rf-PGD-TOFMS for depth profiling of an oxidized thin film composite [2016]

    Category:
    Artículos
    Authors:
    Nerea Bordel García , Alfredo Sanz Medel , José Félix Fuertes Martínez , R. Sandín , Jorge Pisonero Castro , Cristina González Gago
    Date:
    01 of January of 2016
    It Is a Part of:
    Journal of Analytical Atomic Spectrometry