Industrial and Intellectual Property
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Analytical potential of rf-PGD-TOFMS for depth profiling of an oxidized thin film composite [2016]
- Category:
- Artículos
- Authors:
- Nerea Bordel García , Alfredo Sanz Medel , José Félix Fuertes Martínez , R. Sandín , Jorge Pisonero Castro , Cristina González Gago
- Date:
- 01 of January of 2016
- It Is a Part of:
- Journal of Analytical Atomic Spectrometry